Battery knowledge · Materials analysis and post-mortem
Time-of-flight secondary ion mass spectrometry
Sputtering the outermost atomic layers of a sample with a pulsed ion beam and weighing the ejected ions by how long they take to reach the detector. It detects every element, lithium and hydrogen included, at parts-per-million levels, and maps SEI fragments across a surface and, with a second sputter beam, in depth.
- Abbreviation
- ToF-SIMS
- Also called
- SIMS, secondary ion mass spectrometry
Example
Materials analysis and post-mortem: an example situation
Surface and bulk measurements may find different compositions in the same electrode without contradiction.
Read Time-of-flight secondary ion mass spectrometry alongside Post-mortem analysis in this context. Opening an aged or failed cell in an inert glovebox and examining its electrodes by microscopy, diffraction and chemical analysis. It confirms which degradation mechanisms actually occurred rather than inferring them from voltage.
Use in Lemonergy
Connect results with scale and specimen preparation.
This is a reference concept. No executable Lemonergy block has been verified for this term.
References & further reading
Further reading on this topic
These sources provide broader context; they are not presented as citations for every statement in this entry.
- Advanced characterization techniques for solid state lithium battery research
Yuxuan Xiang, Xia Li, Yongqiang Cheng, Xueliang Sun, Yong Yang · Materials Today · 2020
Topic background · X-ray, solid-state NMR and neutron methods in solid-state battery research.