External short-circuit test

Example

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Abuse testing

Deliberately driving cells and packs beyond their limits — overcharge, crush, nail penetration, external short, heating, drop — to see how they fail. Standards define each test and rank the outcome on a hazard scale from no effect to explosion.

External short circuit

A low-resistance connection between the terminals outside the cell, driving currents of hundreds of amperes. Fuses, the current interrupt device and a positive-temperature-coefficient element are the layers of protection against it.

Fuse

A link that melts and opens the circuit when current exceeds its rating. Packs use a main fuse in the high-voltage path and often a small fuse on each parallel cell connection, so one shorted cell does not drain its neighbours into the fault.

Positive temperature coefficient device

A polymer element in series with a cell whose resistance jumps when it heats, choking an external short-circuit current. It resets as it cools, unlike a fuse, but adds resistance and does not help against internal faults.

References & further reading

Further reading on this topic

These sources provide broader context; they are not presented as citations for every statement in this entry.

1. Thermal runaway mechanism of lithium ion battery for electric vehicles: A review

   Xuning Feng et al. · Energy Storage Materials · 2018

   Topic background · Electrical, mechanical and thermal abuse; thermal-runaway mechanisms and propagation.