{
  "node": {
    "id": "term:k-value",
    "type": "Term",
    "label": "K-value",
    "properties": {
      "id": "k-value",
      "name": "K-value",
      "aka": [
        "OCV drop rate"
      ],
      "section": "topic-manufacturing",
      "definition": "The rate at which a cell’s open-circuit voltage falls during the production aging step, in millivolts per day. A high K-value signals an internal short or contamination, and such cells are scrapped before shipment.",
      "unit": "mV/day",
      "related": [
        "aging-step",
        "self-discharge",
        "open-circuit-voltage",
        "internal-short-circuit"
      ],
      "url": "https://lemonergy.com/learn/glossary/k-value/",
      "mentions": []
    }
  },
  "edges": [
    {
      "id": "edge:2501",
      "source": "term:k-value",
      "target": "topic:topic-manufacturing",
      "type": "belongsTo",
      "properties": {
        "sourceFile": "terms.json"
      }
    },
    {
      "id": "edge:2502",
      "source": "term:k-value",
      "target": "term:aging-step",
      "type": "relatedTo",
      "properties": {
        "sourceFile": "terms.json",
        "meaning": "Related context; not a causal claim"
      }
    },
    {
      "id": "edge:2503",
      "source": "term:k-value",
      "target": "term:self-discharge",
      "type": "relatedTo",
      "properties": {
        "sourceFile": "terms.json",
        "meaning": "Related context; not a causal claim"
      }
    },
    {
      "id": "edge:2504",
      "source": "term:k-value",
      "target": "term:open-circuit-voltage",
      "type": "relatedTo",
      "properties": {
        "sourceFile": "terms.json",
        "meaning": "Related context; not a causal claim"
      }
    },
    {
      "id": "edge:2505",
      "source": "term:k-value",
      "target": "term:internal-short-circuit",
      "type": "relatedTo",
      "properties": {
        "sourceFile": "terms.json",
        "meaning": "Related context; not a causal claim"
      }
    }
  ],
  "neighbors": [
    {
      "id": "topic:topic-manufacturing",
      "type": "Topic",
      "label": "Manufacturing",
      "properties": {
        "id": "topic-manufacturing",
        "name": "Manufacturing",
        "lede": "The steps that turn powders and foils into a finished cell, in production order.",
        "context": "Place operations and quality checks in process order.",
        "example": "An electrode can meet coating mass targets but fail adhesion or moisture checks later.",
        "lesson_url": "https://lemonergy.com/learn/fundamentals/cell-production/",
        "lesson_label": "Open production"
      }
    },
    {
      "id": "term:aging-step",
      "type": "Term",
      "label": "Aging (production)",
      "properties": {
        "id": "aging-step",
        "name": "Aging (production)",
        "aka": [
          "high-temperature aging",
          "storage step"
        ],
        "section": "topic-manufacturing",
        "definition": "Storing freshly formed cells for days to weeks, at room or elevated temperature, so the SEI stabilises and any cell with a latent short reveals itself through voltage drop. Not to be confused with aging as degradation over a cell’s life.",
        "related": [
          "formation",
          "k-value",
          "cell-finishing",
          "aging"
        ],
        "lesson": "fundamentals/cell-production/#finishing",
        "url": "https://lemonergy.com/learn/glossary/aging-step/",
        "mentions": [
          "sei"
        ]
      }
    },
    {
      "id": "term:self-discharge",
      "type": "Term",
      "label": "Self-discharge",
      "properties": {
        "id": "self-discharge",
        "name": "Self-discharge",
        "section": "topic-charging",
        "definition": "The slow loss of stored charge while a cell is not in use. An unexpected rise can signal a leakage path or a soft internal short.",
        "unit": "%/month",
        "related": [
          "internal-short-circuit",
          "calendar-aging",
          "k-value",
          "calendar-life",
          "self-discharge-test"
        ],
        "lesson": "fundamentals/battery-aging/#check-yourself",
        "url": "https://lemonergy.com/learn/glossary/self-discharge/",
        "mentions": []
      }
    },
    {
      "id": "term:open-circuit-voltage",
      "type": "Term",
      "label": "Open-circuit voltage",
      "properties": {
        "id": "open-circuit-voltage",
        "name": "Open-circuit voltage",
        "abbr": "OCV",
        "section": "topic-state",
        "definition": "The voltage across a cell’s terminals when no current flows and the cell has rested long enough for the voltage to settle. It depends on state of charge and temperature, and a cell whose open-circuit voltage falls unusually fast in storage may have an internal short.",
        "unit": "V",
        "related": [
          "ocv-soc-curve",
          "relaxation",
          "voltage-hysteresis",
          "k-value",
          "internal-short-circuit"
        ],
        "lesson": "fundamentals/cell-production/#finishing",
        "url": "https://lemonergy.com/learn/glossary/open-circuit-voltage/",
        "mentions": [
          "state-of-charge"
        ]
      }
    },
    {
      "id": "term:internal-short-circuit",
      "type": "Term",
      "label": "Internal short circuit",
      "properties": {
        "id": "internal-short-circuit",
        "name": "Internal short circuit",
        "abbr": "ISC",
        "section": "topic-safety",
        "definition": "An unintended electronic path between the electrodes inside a cell — through a metal particle, a burr, a damaged separator or lithium deposits. It discharges the cell internally and turns its energy into local heat.",
        "related": [
          "thermal-runaway",
          "dendrite",
          "separator",
          "external-short-circuit",
          "self-discharge",
          "internal-short-trigger-device"
        ],
        "lesson": "fundamentals/cell-anatomy/#short-circuit",
        "url": "https://lemonergy.com/learn/glossary/internal-short-circuit/",
        "mentions": [
          "electronic-path",
          "burr",
          "metal-particle-contamination"
        ]
      }
    }
  ]
}